2017 January 25 - March 7
2017 March 15 - April 24
2017 May 17 - June 29
2017 Proposal deadline: 03/20/17
2017 BTR deadline: 04/17/17
2017 October 11 - December 21
2017 Proposal deadline: 08/01/17
2017 BTR deadline: 09/10/17
- Beams of high energy x-rays (50-80keV) transmit through metallic samples
- Monochromatic and white beam diffraction and tomography capabilities
- Sophisticated In situ loading and heating capabilities
- Support for both x-ray experiments and material behavior simulations
- Under ONR funding, enhanced support for industrial users
To provide user support for structural materials with a scientific and engineering staff dedicated to providing state-of-the-art specimen handling, in-hutch instrumentation for high-energy x-ray beams, data collection software, and computational tools for analysis, visualization and interpretation.
Why Choose InSitμ?
The team at InSitµ provides enhanced support for a new generation of industrial users, strengthening your experience during the experiment and simulation.
We are material modelers. We work with mechanical civil, and structural engineers to create mathematical modeling, build a computational prototype, and then validate that modeling design to measure, understand and account for stress.
Capabilities of InSitμ
- Polychromatic “white” beam diffraction: The white beam capability of the new CHESS-U sector 1 will enable detailed maps of stress gradients at an engineering sized scale, up to several centimeters of depth within an engineering component.
- Monochromatic experiments: Using the rotating crystal method, diffraction experiments are conducted on polycrystalline metallic samples. In-situ loading and heating stages enable collection of data “during” elastic-plastic deformation. Both polycrystalline grain maps and the mechanical response at the crystal and aggregate scale can be determined using the software infrastructure resident at the beamline.
- Real time processes: X-ray pixel array detectors suitable for use with InSitμ’s very hard x-rays are being developed by the detector group. These include the Keck-PAD, a burst-rate imager suitable for processes on the microsecond time scale and the MM-PAD, a wide dynamic imager for millisecond time scale processes and total scattering. Both CdTe and GaAs x-ray converters will be utilized, enabling real-time understanding of processes such as high speed impact, stress relaxation, solidification and phase transformations. For more information, see [link].
- Model support: Much of the utility and potential of the high energy x-ray diffraction data is using them in conjunction with sophisticated multi-scale material models. The enhanced support given by our engineers at InSitµ extends to these models as well.
Characterize microscale material structure and behavior using high energy x-rays
Many industrial processes such as welding induce deleterious conditions such as residual stress. High energy x-ray diffraction enables the determination of high fidelity residual stress maps, that can be compared to process simulations for model validation.
|A2||1.5m CHESS Compact Undulator||Resonant & non-resonant scattering; Single crystals & thin films; High-energy powder diffraction and PDF; Reciprocal space mapping; low temperatures and custom sample environments||5-70 keV||Pilatus (100K,300K,6M); PiXirad-1; GE Amorphous Si panel; Dexela; XFlash, Si and Ge energy-dispersive detectors; Cyberstar scintillation detector||Jacob Ruff|
|F2||200 mA e+, 24 pole wiggler||High Energy x-ray experiments, near-field & far-field diffraction and tomography||38-80 keV||GE Detector 2048x2048, 200 µm pixels & Retiga 4000DC, LuAG:Ce scintillator||Peter Ko|
The InSitμ Team
Materials Genome Initiative- and Integrated Computational Materials Engineering-Inspired Projects
Combine diffraction data with high fidelity simulation results for a comprehensive understanding of microstructure and micromechanical response