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X-RAY RUNS: Apply for Beamtime

2017  Nov 1 - Dec 21

2018  Feb 7 - Apr 3
2018  Proposal/BTR deadline: 12/1/17

2018  Apr 11 - Jun 4
2018  Proposal/BTR deadline: 2/1/18


  • Beams of high energy x-rays (50-80keV) transmit through metallic samples
  • Monochromatic and white beam diffraction and tomography capabilities
  • Sophisticated In situ loading and heating capabilities
  • Support for both x-ray experiments and material behavior simulations
  • Under ONR funding, enhanced support for industrial users



To provide user support for structural materials with a scientific and engineering staff dedicated to providing state-of-the-art specimen handling, in-hutch instrumentation for high-energy x-ray beams, data collection software, and computational tools for analysis, visualization and interpretation.

Why Choose InSitμ?

The team at InSitµ provides enhanced support for a new generation of industrial users, strengthening your experience during the experiment and simulation.

We are material modelers. We work with mechanical civil, and structural engineers to create mathematical modeling, build a computational prototype, and then validate that modeling design to measure, understand and account for stress.

Capabilities of InSitμ

  1. Polychromatic “white” beam diffraction: The white beam capability of the new CHESS-U sector 1 will enable detailed maps of stress gradients at an engineering sized scale, up to several centimeters of depth within an engineering component.
  2. Monochromatic experiments: Using the rotating crystal method, diffraction experiments are conducted on polycrystalline metallic samples. In-situ loading and heating stages enable collection of data “during” elastic-plastic deformation. Both polycrystalline grain maps and the mechanical response at the crystal and aggregate scale can be determined using the software infrastructure resident at the beamline.
  3. Real time processes: X-ray pixel array detectors suitable for use with InSitμ’s very hard x-rays are being developed by the detector group. These include the Keck-PAD, a burst-rate imager suitable for processes on the microsecond time scale and the MM-PAD, a wide dynamic imager for millisecond time scale processes and total scattering. Both CdTe and GaAs x-ray converters will be utilized, enabling real-time understanding of processes such as high speed impact, stress relaxation, solidification and phase transformations. For more information, see [link].
  4. Model support: Much of the utility and potential of the high energy x-ray diffraction data is using them in conjunction with sophisticated multi-scale material models. The enhanced support given by our engineers at InSitµ extends to these models as well.

Characterize microscale material structure and behavior using high energy x-rays


Many industrial processes such as welding induce deleterious conditions such as residual stress. High energy x-ray diffraction enables the determination of high fidelity residual stress maps, that can be compared to process simulations for model validation.


Beamline Statistics:

Station Source Technique Energy Detector(s) Contact
A2 1.5m CHESS Compact Undulator Resonant & non-resonant scattering; Single crystals & thin films; High-energy powder diffraction and PDF; Reciprocal space mapping; low temperatures and custom sample environments 5-70 keV Pilatus (100K,300K,6M); PiXirad-1; GE Amorphous Si panel; Dexela; XFlash, Si and Ge energy-dispersive detectors; Cyberstar scintillation detector Jacob Ruff
F2 200 mA e+, 24 pole wiggler High Energy x-ray experiments, near-field & far-field diffraction and tomography 38-80 keV GE Detector 2048x2048, 200 µm pixels & Retiga 4000DC, LuAG:Ce scintillator Peter Ko

 The InSitμ Team

 Materials Genome Initiative- and Integrated Computational Materials Engineering-Inspired Projects

 Combine diffraction data with high fidelity simulation results for a comprehensive understanding of microstructure and micromechanical response